Radiation Vulnerability Analysis Using High Efficiency Compact Modeling
The solution to these problems involves enhancement of the device models used to predict circuit performance to include charge-sharing SET effects. This in turn requires high-fidelity device models, charge-sharing SET models and finally an approach to utilize the models on the standard libraries of components of which integrated circuits are constructed.134- 138. [42] Y. Cheng and C. Hu, MOSFET Modeling aamp; BSIM3 Usera#39;s Guide, 1999. [43] W. Liu and Liu, MOSFET Models for SPICE Simulation Including BSIM3v3 and BSIM4, 2001. [44] Spectre Simulator Usera#39;s Guide, Cadence, Inc., 2008.
| Title | : | Radiation Vulnerability Analysis Using High Efficiency Compact Modeling |
| Author | : | Anthony Matthew Francis |
| Publisher | : | ProQuest - 2009 |
You must register with us as either a Registered User before you can Download this Book. You'll be greeted by a simple sign-up page.
Once you have finished the sign-up process, you will be redirected to your download Book page.
How it works:- 1. Register a free 1 month Trial Account.
- 2. Download as many books as you like (Personal use)
- 3. Cancel the membership at any time if not satisfied.
